The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2003

Filed:

Aug. 10, 2001
Applicant:
Inventors:

Richard J. Gambino, Stony Brook, NY (US);

Miriam Rafailovich, Plainview, NY (US);

Shaoming Zhu, Stony Brook, NY (US);

Jhon F Londono, Mineola, NY (US);

Johnathan Sokolov, Plainview, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1302 ; B44C 1/22 ;
U.S. Cl.
CPC ...
H01L 2/1302 ; B44C 1/22 ;
Abstract

A giant magnetoresistance (GMR) sensor is formed using a self organizing diblock copolymer as an etching mask. The diblock copolymer is deposited over a magnetic layer and is self organized into regions of two discrete thicknesses; higher thickness island regions separated by lower thickness valley regions. After the diblock layer is self organized, an etching of process is performed to remove the polymer material from the valley regions as well as the underlying magnetic material. After etching, a patterned magnetic thin film of submicron islands of magnetic material, preferably having a diameter in the single domain range, remain under the mesa region. The islands are interconnected by a non-magnetic, conductive layer with electrical contacts coupled thereto to complete the GMR sensor. When the sensor is not subjected to a magnetic field, the magnetic alignment of the islands is random, and electron scattering results in a high resistance state. When the sensor is magnetically saturated, the magnetic islands have a common magnetic alignment, resulting in reduced sensor resistance.


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