The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2003

Filed:

Jun. 01, 2001
Applicant:
Inventors:

Brent A. Enck, Rio Oso, CA (US);

Andrea Martin, Granite Bay, CA (US);

David S. Flood, Auburn, CA (US);

John Green, Rocklin, CA (US);

James A. Knoop, West Seattle, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 ;
U.S. Cl.
CPC ...
G06F 3/00 ;
Abstract

Methods and systems that adaptively measure and collect performance data are disclosed. An exemplary method includes acquiring system performance data in accordance with a performance policy. Then, data measurement and collection is dynamically adjusted based on the performance policy and a detected system condition. An alternative method includes establishing a self-monitoring data collection policy. At least one system performance metric is then measured in accordance with the self-monitoring data collection policy. The at least one system performance metric is evaluated to determine system health. The system performance metric measuring step is then dynamically adjusted based on the self-monitoring data collection policy and the system health. The steps of measuring, evaluating and dynamically adjusting are then repeated.


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