The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2003
Filed:
Mar. 27, 2001
Gregory David Shteinhauz, Akron, OH (US);
The Goodyear Tire & Rubber Company, Akron, OH (US);
Abstract
Methods and apparatus for predicting tire uniformity, preferably a harmonic component of force variation for a production tire, preferably when operating at a high speed, and also method and apparatus for manufacturing tires and controlling the manufacturing of tires in response to quality control based on a comparison of a production tire's predicted uniformity versus predetermined criteria. A production tire's predicted tire uniformity is determined by a calculation using transfer functions applied to production tire measurement data from factory floor testing equipment which includes a factory floor balance checker and a factory floor tire uniformity machine. The transfer functions are determined by calculations involving a combination of measurements on a tire sample which preferably comprises one or more tires of the same construction as the production tire for which predictions are desired. The combination of measurements includes measurements on a factory floor balance checker, on a factory floor tire uniformity machine, and on a test lab tire uniformity machine. The test lab tire uniformity machine is preferably operated at a speed higher than the factory floor tire uniformity machine, and most preferably at a speed approximately equal to the speed at which the predicted uniformity is desired.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile