The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2003

Filed:

Jul. 26, 1999
Applicant:
Inventors:

John Gordon Rushbrooke, Cambridge, GB;

Claire Elizabeth Hooper, Cambridge, GB;

William Wray Neale, late of Cambridge, GB;

by Ann Neale, personal representative, Cambridge, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

The present invention provides a detection system comprising means ( ) for supporting a multiple sample assay ( ) in an inspection station, plural addressable photosensitive detector elements in an array ( ) which is positioned relative to the inspection station, means ( ) for addressing the groups of elements at regularly occurring intervals of time so as to generate linked numerical values for analysis, means ( ) for computing the arithmetic mean of the linked numerical values read out, and means for supplying as output information the numerical value of the computed arithmetic mean of the linked values. A method of analyzing a multiple sample assay is also provided. In order to enable corrections for the effects of chemical or color quench, the system can be calibrated by performing a large number of exposures of at least part of the array to a sample of known, constant activity and having a known amount or concentration of quenching agent, and repeating this process for each of a number of other samples with differing amounts or concentrations of said agent. The photosensor outputs obtained in the course of these processes are statistically analyzed to provide an index from which look-up tables for color and/or chemical quench correction can be compiled.


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