The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2003

Filed:

May. 10, 2002
Applicant:
Inventors:

Jeffrey A. Olson, Libertyville, IL (US);

Ronald B. Jones, Mundelein, IL (US);

Vicki L. Nienaber, Gurnee, IL (US);

Steven W. Muchmore, Libertyville, IL (US);

Jeffrey Y. Pan, Lake Forest, IL (US);

Jonathan Greer, Chicago, IL (US);

Assignee:

Abbott Laboratories, Abbott Park, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/320 ;
U.S. Cl.
CPC ...
G01N 2/320 ;
Abstract

Method for mounting a sample comprising a crystal for X-ray crystallographic analysis, a method for aligning a sample comprising a crystal for X-ray crystallographic analysis, which sample is mounted on a positioning device, and a method for determining the structure of a sample containing a crystal by means of X-ray crystallography. The method includes activating a robot so that the tool retrieves the crystal holder, receives a sufficient amount of a fluid to maintain the crystal in the crystal holder at a temperature not in excess of about 160 degrees K, transfers the retrieved crystal holder to a positioning device, and mounts the transferred crystal holder on the positioning device, whereby the crystal in the retrieved crystal holder is maintained at a temperature not in excess of about 160 degrees K.


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