The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2003

Filed:

Jul. 17, 1998
Applicant:
Inventors:

Roger Y. Tsien, La Jolla, CA (US);

Peter J. Coassin, Encinitas, CA (US);

Andrew A. Pham, Del Mar, CA (US);

Alec Tate Harootunian, Del Mar, CA (US);

Minh Vuong, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ; G01N 2/164 ; G01N 2/166 ;
U.S. Cl.
CPC ...
G01N 2/100 ; G01N 2/164 ; G01N 2/166 ;
Abstract

The invention provides for a detector assembly, fiber assembly and screening system for optical measurements.


Find Patent Forward Citations

Tsien, Roger. (2003). Detector and screening device for ion channels (U.S. Patent No. 6608671). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6608671

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…