The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2003
Filed:
Apr. 27, 2001
Toru Ikeda, Koriyama, JP;
Yasushi Fukui, Sasebo, JP;
Tomomitsu Yaginuma, Koriyama, JP;
Hidenori Ochiai, Koriyama, JP;
Oliver Humbach, Alzenau-Michelbach, DE;
Ralph Sattmann, Aschaffenburg, DE;
Other;
Abstract
A method for measuring trace quantities of OH groups in quartz glass comprises preparing a set of test pieces comprising a reference test piece from a blank of a quartz glass body whose OH group content is known and a sample test piece from a quartz glass body whose OH group content is to be measured, having two planar planes faced to each other, setting the sample test piece and the reference test piece in an infrared spectrophotometer; successively irradiating perpendicular to one of the two planar planes an incident infrared radiation in a wavelength region of approximately 2500 nm to approximately 2950 nm, while simultaneously detecting the outgoing radiation spectrum from the other plane; obtaining the difference of the outgoing radiation spectrum of each of the test pieces; selecting the absorbance peak assigned to OH groups at a wavelength of 2720 nm to obtain the peak height thereof; and calculating the concentration of OH groups from the peak height in the sample test piece.