The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2003

Filed:

Dec. 18, 2000
Applicant:
Inventor:

Hubert Kuderer, Waldbronn, DE;

Assignee:

Agilent Technologies Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 4/114 ;
U.S. Cl.
CPC ...
H01J 4/114 ;
Abstract

The invention concerns a method and device to carry out the method to provide quality control for a photosensor, especially a photodiode array, whose output signal depends on the intensity of an input signal formed by electromagnetic waves. The photosensor to be tested receives stimulation signals forming the input signals while the stimulation signal intensity of the stimulation signals is varied. The associated output signals of the photosensor to be tested are measured and recorded for evaluation purposes. The photosensor preferably receives at least two independently controllable, superposed individual stimulation signals with individual intensities. The different stimulation signal intensities of the individual stimulation signals are set with the aid of a controller coupled to stimulation signal source, and the output signals of the photosensor are measured and recorded using a measurement data recorder unit.


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