The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2003
Filed:
Jul. 10, 2000
Applicant:
Inventors:
Thierry Livache, Janie, FR;
Patrice Caillat, Echirolles, FR;
Assignee:
Commissariat a l' Energie Atomique, Paris, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/166 ; G01R 3/126 ;
U.S. Cl.
CPC ...
H01L 2/166 ; G01R 3/126 ;
Abstract
A method and device for testing an electronic chip ( ) having on the surface a plurality of addressable electrically conductive sensitive elements ( ) in which the sensitive elements on the chip are put in contact with a conductive solution ( ), one or more sensitive elements ( ) are addressed selectively in order to apply to each sensitive element addressed an electrical test signal referred to as an input signal, and a signal, referred to as the output signal, on an electrode ( ) also in contact with the conductive solution, is measured.