The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6606918 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 19, 2003

Filed:

May. 07, 2001
Applicant:
Inventors:

Gary L. Day, Hudson, OH (US);

Michael Carroll, Akron, OH (US);

Neal G. Sehm, Akron, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/08 ; G01N 3/32 ; G01N 3/00 ; G01D 7/00 ;
U.S. Cl.
CPC ...
G01N 3/08 ; G01N 3/32 ; G01N 3/00 ; G01D 7/00 ;
Abstract

A strain testing apparatus which places tensile forces on a sheet, a film, or the like samples in at least two axes and generally in a radial direction. The multi-axial strain testing apparatus comprises a clamping assembly having at least two clamping members, and a sample securing portion arranged in a substantially radial manner about a point. The multi-axial strain testing apparatus can advantageously be employed to test crack growth propagation and flex fatigue in rubber polymer and elastomer samples.


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