The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2003

Filed:

Aug. 21, 1999
Applicant:
Inventors:

Elizabeth Lynn Borowsky, Brookline, MA (US);

Richard Golding, San Francisco, CA (US);

Arif Merchant, Los Altos, CA (US);

Mirjana Spasojevic, Palo Alto, CA (US);

John Wilkes, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 ; G06F 1/710 ; G06F / ;
U.S. Cl.
CPC ...
G06F 7/60 ; G06F 1/710 ; G06F / ;
Abstract

Data storage devices of an enterprise system are tested to determine whether the enterprise system is optimally configured. Each data storage device is tested to determine whether it can satisfy a performance requirement for an assigned group of n workloads. A group of n inequalities are generated, and only up to n of the inequalities may be evaluated to determine whether the device satisfies the performance requirement for the assigned group of workloads. The inequalities are based on a phased, correlated model of I/O activity.


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