The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2003

Filed:

Aug. 16, 2000
Applicant:
Inventor:

Yeming Gu, Suwanee, GA (US);

Assignee:

NCR Corporation, Dayton, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/760 ;
U.S. Cl.
CPC ...
G06F 1/760 ;
Abstract

A method of combining spectral data with non-spectral data which uses a defined distance measure of likeness (DML) value and conditional probabilities. The method includes the steps of collecting the spectral and non-spectral data for the produce item, determining DML values between the spectral and the non-spectral data and reference produce data for a plurality of types of produce items, determining conditional probability densities for all of the types of produce items using the DML values, combining the conditional probability densities to form a combined conditional probability density, and determining probabilities for the types of produce items from the combined conditional probability density.


Find Patent Forward Citations

Loading…