The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2003

Filed:

May. 25, 2000
Applicant:
Inventors:

Doron Shaked, Haifa, IL;

Avraham Levy, Kiryat-Tivon, IL;

Izhak Baharav, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 ;
U.S. Cl.
CPC ...
G06K 9/40 ;
Abstract

A method and system for correcting geometric deformations in an aligned image. A shape deformation correction unit is provided for receiving the aligned image and based thereon for generating a shape-corrected image. A space deformation correction unit is coupled to the shape deformation correction unit and receives the shape-corrected image. The space deformation correction unit uses the shape-corrected image to generate edges and interfaces, and further generates a corrected image based on the interfaces and the shape-corrected image.


Find Patent Forward Citations

Shaked, Doron. (2003). Geometric deformation correction method and system for dot pattern images (U.S. Patent No. 6606421). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6606421

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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