The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2003

Filed:

Apr. 27, 2000
Applicant:
Inventors:

Toshiharu Ishibashi, Kariya, JP;

Hirotoshi Nakamura, Nagoya, JP;

Tadao Nojiri, Oobu, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 1/906 ;
U.S. Cl.
CPC ...
G06K 1/906 ;
Abstract

A two-dimensional code and a predetermined figure pattern are printed on a medium. An error in the two-dimensional code is correctable during decoding of the two-dimensional code. A cell position corresponding to a position of the error is detectable. The predetermined figure pattern is made of special ink. The two-dimensional code and the predetermined figure pattern overlap each other at a specified place in the medium. The two-dimensional code is optically read from the medium. The two-dimensional code which has been optically read is decoded. In cases where error correction is executed during the decoding of the two-dimensional code, detection is given of an error correction position corresponding to a cell position having a related error. A determination is made as to whether or not the detected error correction position is in the specified place. Judging whether or not the medium is counterfeit is executed in response to a result of the determination.


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