The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2003
Filed:
Apr. 19, 2000
Tuang Liang Bernard Lim, Singapore, SG;
Myint Ngwe, Singapore, SG;
Hwee Peng Teo, Singapore, SG;
Fong Kheon Chong, Singapore, SG;
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
Apparatus for detecting defect in a recordable medium such as a disc drive is disclosed. The apparatus includes a recording system which write and read test data on the medium. The apparatus also includes a first comparator for comparing the read data to a first threshold. A first and a second counter, operably connected to the first comparator, are incremented when the read data exceeds the first threshold. When the first counter obtains a first count value, a first defect signal is produced. Data domains associated with the recordable medium are marked as bad in response to the first defect signal. When the second counter obtains a second count value, a second defect signal is produced and data sectors associated with the recordable medium are marked as bad in response to the second defect signal. A method for detecting defects in a recordable medium is also disclosed.