The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2003
Filed:
Jul. 09, 1999
Applicant:
Inventor:
Tatefumi Oda, Aichi, JP;
Assignee:
Nidek Co., Ltd., Aichi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/101 ;
U.S. Cl.
CPC ...
G01N 2/101 ;
Abstract
A sample inspecting apparatus which performs a visual inspection of a sample to be inspected by reflected light therefrom, the apparatus comprising holding device which holds the sample at its periphery, first rotating device which rotates the holding device on a first axis passing through an approximate center of the sample being held by the holding device and second rotating device which rotates the holding device on a second axis passing through the approximate center of the sample being held by the holding device.