The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2003

Filed:

Sep. 28, 2001
Applicant:
Inventors:

Hiroshi Nakanishi, Yawata, JP;

Takashi Shibatani, Kashihara, JP;

Hiroshi Hamada, Nara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 ; G02F 1/1337 ;
U.S. Cl.
CPC ...
G02F 1/1335 ; G02F 1/1337 ;
Abstract

An optical lens system in accordance with the present invention is arranged so that, when the micro-lens has a curved surface satisfying an inequality of (n /n )&times;sin(&thgr;max)&gE;1, where n1 indicates an index of refraction of a medium constituting one side of the curved surface of the lens, n2 (n <n ) indicates an index of refraction of a medium constituting the other side of the curved surface of the lens, &thgr; indicates an incident angle of the light with respect to a plane-normal of the curved surface of the lens when the light from the light source is directed to the curved surface of the lens of the micro-lens from a side of the medium having the index of refraction of n and &thgr; max indicates a maximum value of the angle &thgr; in the curved surface of the micro-lens, the micro-lens array is provided so that the light from the light source is directed to the micro-lens from the side of the medium having the index of refraction of n1. When using such an optical lens system as an image display apparatus of projection-type, it is possible to obtain the bright projection image.


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