The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2003
Filed:
Feb. 23, 2001
Kouichi Shimamura, Nagano, JP;
Fujitsu Nagano Systems Engineering Limited, Nagano, JP;
Abstract
A three-dimensional model analyzing apparatus for optimally segmenting a three-dimensional model to be analyzed. Input unit inputs a three-dimensional model to be analyzed, and rotated model generating unit causes the three-dimensional model input from the input unit to rotate successively by a predetermined angle in a three-dimensional space, to generate a plurality of rotated models derived at different angles. Segmenting unit segments each of the rotated models into a plurality of polyhedrons having an identical shape, and comparing unit compares the surface area or volume of each rotated model segmented by the segmenting unit with the surface area or volume of the original three-dimensional model. Presenting unit presents an optimum rotated model in accordance with the results of comparison by the comparing unit.