The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2003

Filed:

Sep. 13, 2001
Applicant:
Inventors:

Yoav Paltieli, Haifa, IL;

Ron Nagar, Haifa, IL;

David Taran, Tel Aviv, IL;

Assignee:

Ultraguide Ltd., Yokneam, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/900 ;
U.S. Cl.
CPC ...
G01N 2/900 ;
Abstract

There are disclosed systems for calibrating a first position measuring component on an imaging or scanning transducer with respect to the scanning plane. Calibrations are performed by using a calibrating device including an additional or second position measuring component, such that during the calibration process, the relative position of between these position measuring components can be calculated. Calibrations are also performed by viewing targets on the scanning plane that are at a known position with respect to the second position measuring component. Calibrations are also performed based on the to scanning plane and position measuring component on a guided device, such as a needle, that typically is used in conjunction with the imaging or scanning transducer. Methods for these calibrations are also disclosed.


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