The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
Nov. 21, 2001
Tyler Thorp, Sunnyvale, CA (US);
Devendra Vidhani, Sunnyvale, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A technique for verifying on-chip decoupling capacitance using transistor and capacitor surface area information is provided. The technique broadly includes determining a surface area of a transistor, determining a surface area of a decoupling capacitor, comparing the surface area of the transistor to the surface area of the decoupling capacitor to obtain a surface area ratio, and verifying whether there is enough decoupling capacitance based on the surface area ratio. Further, the present invention also provides a technique for determining when and how to redesign a microprocessor in order to have sufficient decoupling capacitance.