The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
Dec. 30, 1999
George A. Bednekoff, Plano, TX (US);
Mitchell K. Johnson, McKinney, TX (US);
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
A measurement and calibration circuit is disclosed for use in a RF transceiver comprising an antenna and a RF receiver, having a receive path, coupled to the antenna. The measurement and calibration circuit comprises: a test signal generator for generating a known amplitude and frequency test signal; a switch having an input coupled to the test signal generator, a first output coupled to an input of the receive path, and a second output coupled to the antenna; a test controller for causing the switch to directly inject the test signal into the input of the receive path and causing the switch to inject the test signal into the antenna, wherein the antenna at least partially reflects the test signal into the receive path; and a signal monitor coupled to an output of the receive path for measuring the direct injected test signal and the reflected test signal.