The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2003

Filed:

Oct. 19, 2000
Applicant:
Inventors:

Masakazu Taguchi, Kawasaki, JP;

Satoshi Furuta, Kato, JP;

Toru Fujiwara, Kato, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/76 ;
U.S. Cl.
CPC ...
G11B 5/76 ;
Abstract

A data reproduction system, which determines reproduced data based on comparison results of path metrics calculated in accordance with a Viterbi algorithm based on branch metrics calculated from expected values and a sampled value of a readout signal, includes an expected value setting unit for variably setting the expected values used for a calculation of the branch metrics in order to perform a Viterbi detection process without being easily affected by the transient response, offset variation, phase error and nonlinear torsion component of the readout signal. The readout signal is obtained from a recording medium on which data is recorded in accordance with a recording signal of a partial response waveform, the expected values are determined by the partial response waveform, and the sampled value is obtained by sampling the readout signal at a predetermined frequency.


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