The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
Apr. 08, 2002
Applicant:
Inventors:
Kumiko Matsui, Yokohama, JP;
Hisashi Okugawa, Yokosuka, JP;
Assignee:
Nikon Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/100 ;
U.S. Cl.
CPC ...
G02B 1/100 ;
Abstract
A minute particle optical manipulation method and a minute particle optical manipulation apparatus are capable of simply strengthening a trapping force in an optical-axis direction and expanding a range where the trapping for acts in the optical-axis direction without requiring an optical element such as a special prism etc., and obtaining the trapping force enough to trap the particle even when the minute particle exists deep within a medium while keeping the trapping force when the minute particle is in a shallow position within the medium.