The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
Feb. 03, 2000
Ansgar Kaupp, Ahrensburg, DE;
Basler, AG, Ahrensburg, DE;
Abstract
The invention pertains to a method for examining a series of objects that are symmetrical in reference to a rotational axis, e.g., circular disks, during or after the manufacturing process of the disks. In particular, the invention pertains to the optical examination of circular data carriers, e.g., CD, DVDs, CD-Rs or the like. The invention proposes that each object contains at least one marking or is provided with at least one marking. The marking makes it possible to unequivocally determine the angular position of each object about the rotational axis in reference to the marking for objects manufactured in the same manufacturing process. At least one section of the objects is scanned by at least one scanning element, and the marking is detected during the examination process. The scanning result and/or examination result of geometric regions with corresponding positions on the objects in reference to the marking is determined and/or evaluated and/or displayed on a display element in the same angular position in reference to the marking. A defect that always occurs at the same position will always have the same geometric data independent of the rotation of the object to be examined during its transport to the examination point and can be treated with other criteria.