Semiconductor integrated circuit

Abstract

The objective of this invention is to provide a type of semiconductor integrated circuit which can lessen solution in the circuit area to the minimum necessary level, and can lessen the leakage current in the standby state so as to cut the power consumption, and which allows I test to determine whether it is passed or defective. Logic circuit composed of low threshold voltage transistors and switching circuit composed of transistors having the standard threshold voltage are set. In the operation, the switching circuit is turned ON, and a driving current is fed to logic circuit . On the other hand, in the standby mode, the switching circuit is turned OFF, and the path of the leakage current is cut off to lessen generation of the leakage current. In the case of I test, different bulk bias voltages are applied to the channel regions of PMOS transistors and NMOS transistors from an IC tester through pads P and P . In this way, the leakage current can be lessened on a low level, and whether the semiconductor integrated circuit is passed or defective can be judged from the results of the current measurement.