The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
May. 23, 2000
Kiyoshi Ito, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
An integrated circuit testing apparatus includes a control section including a memory for storing the plurality of testing programs corresponding to the plurality of tests, and a transfer control unit for transferring the plurality of testing programs on the basis of an control command; and an IC testing section including a ROM in which the testing programs transferred from the transfer control means are stored, a RAM in which the test results are temporarily stored, and a processing unit for temporarily storing the test results in the RAM whenever execution of each testing program has been completed, synthesizing all the test results when execution of all the testing programs have been completed to set a final test result for each device to be tested, and sending the final result to the automatic sorter