The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
Jul. 30, 2001
Method and apparatus for the simultaneous determination of surface topometry and biometry of the eye
Applicant:
Inventors:
Benedikt Jean, D-88138 Sigmarszell, DE;
Thomas K. Bende, D-72116 Mossingen, DE;
Adolf F. Fercher, A-1230 Vienna, AT;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract
An apparatus ( ′) for detecting the surface topography of a cornea ( ) of an eye ( ) by dynamic or static projection of a pattern onto the surface of the cornea and detection of the pattern reflected by the cornea, providing preferably simultaneous detection of at least one optical property of a layer disposed beneath the cornea.