The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
Jul. 11, 2001
The Hong Kong Polytechnic University, Kowloon, HK;
Abstract
A single fabric testing apparatus is capable of measuring mechanical and thermal characteristics of a specimen previously carried out in separate testing apparatuses. The single apparatus is provided with a plurality of mechanical and temperature sensors and a heatable top plate. In use, a ram moves the top plate vertically downwards to press a fabric specimen against a bottom plate. The plate is surrounded by a fixed upstanding peripheral skirt against which an outer periphery of the specimen is bent to enable shearing and bending characteristics to be measured. The bottom plate is biased upwards by a spring which is compressed until the top plate is arrested by a fixed frame member. Further downward movement of the ram enables compressibility of the specimen to be determined. A rotatable section of the top plate can be turned by a stepping motor to determine the surface friction characteristics of the specimen.