The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Nov. 24, 1999
Gary Scott Delp, Rochester, MN (US);
Antonius Paulus Engbersen, Feusisberg, CH;
Andreas G. Herkersdorf, Adliswil, CH;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An integrated circuit (i.e., chip under test) includes a control and monitor interface that includes on-chip support for one or more network protocols that allow the chip to be directly coupled to a network. The control and monitor interface defines one or more operations that can be performed on the chip. In a system for testing chips under test, the control and monitor interface of all of the chips under test are coupled to a network, which is also coupled to a control and monitor mechanism. When a chip under test receives a message on the network from the control and monitor mechanism to execute an operation, it performs the requested operation, then reports the results. In this manner much of the intelligence regarding the test can be pushed on-chip, rather than having all of the testing intelligence residing in an external tester. This allows some standardization in tests that are performed from one chip under test to the next.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile