The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2003

Filed:

Dec. 22, 2000
Applicant:
Inventors:

Charles R. Carpenter, Scarborough, ME (US);

Diana N. Sands, Bath, ME (US);

Karen E. Plante, Limington, ME (US);

Brent M. Nelson, Westbrook, ME (US);

Assignee:

Idexx Laboratories, Inc., Westbrook, ME (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 2/500 ; G01N 3/100 ;
U.S. Cl.
CPC ...
G01F 2/500 ; G01N 3/100 ;
Abstract

The present invention provides methods for the calibration of detection and/or quantification assays for a wide variety of analytes in wet or dry chemistry assay systems. The invention involves the use of a reagent and calibrator, which provide a detectable signal after reacting with the analyte to be assayed for. In preferred embodiments the calibrator is provided in gross excess. A mathematical relationship is provided that relates a reaction measurement of the analyte sample with the reagent and a reaction measurement of the calibrator with the reagent as an equation that defines a three dimensional surface. This relationship may be used to calibrate the detection and/or quantification assay.


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