The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Nov. 04, 1999
Applicant:
Inventors:
Yu-Yang Lu, Taipei, TW;
Nai-Yueh Liang, Taipei, TW;
Assignee:
Benq Corporation, Taoyuan, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/114 ;
U.S. Cl.
CPC ...
G01B 1/114 ;
Abstract
A method of measuring sensor chip shift comprises the following steps. First, provide a contact image sensor module comprising a plurality of sensor chips arranged in a row on a main board, with each sensor chip having multiple sensors. Next, provide a test chart with a predetermined pattern. Further, enable the multiple sensors of the contact image sensor module to scan the predetermined pattern of the test chart. Moreover, select signal waves sensed by the sensors at the ends of two adjacent sensor chips. Finally, calculate the gap between the sensors at the ends of the two adjacent sensor chips according to the signal waves.