The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2003

Filed:

Dec. 18, 2000
Applicant:
Inventors:

Tomoyuki Kaneko, Kodaira, JP;

Tokuhiro Murayama, Kodaira, JP;

Tsuneo Kobayashi, Kodaira, JP;

Takao Kokubu, Kodaira, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/124 ;
Abstract

A method and an apparatus for inspecting appearance and shape of a subject body is provided. Installation cost and installation space are reduced, working efficiency is superior and judgement accuracy is high. A first picture taking structure takes a picture of a linear portion of a subject body lighted by a first slit light to obtain appearance data, and a second picture taking structure takes a picture of the same linear portion lighted by a second slit light to obtain shape data. The quality of appearance and shape of the subject body is judged based on the appearance data and the shape data.


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