The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
May. 23, 2000
Chen-Chia Wang, Newark, DE (US);
Sudhir Trivedi, Baltimore, MD (US);
Jacob B. Khurgin, Baltimore, MD (US);
Brimrose Corporation of America, Baltimore, MD (US);
Abstract
This invention is a device and method for the measurement of optical path length. A frequency chirped electromagnetic wave source, such as a laser beam, is split into two branches. A reference branch is projected directly onto a photosensor, while a probe branch is launched towards a target whose distance relative to the reference path is to be determined. A reflected wave from the target is collected and mixed with the reference onto a photosensor. Due to the unequal path lengths traveled by the reference and the reflected probe laser beams as well as the chirped nature of their frequencies, a certain optical frequency difference exists between the two beams. This frequency difference is linearly proportional to the relative optical path length difference between the two laser beams and the relative optical path length can be readily determined by using a photosensor that generates photocurrents linearly proportional to the relative optical frequency differences between the reference and reflected branches.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile