The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6600559 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 29, 2003

Filed:

Mar. 22, 2001
Applicant:
Inventors:

Steven C. Switalski, Rochester, NY (US);

Donald J. Majka, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/502 ; G01N 1/506 ;
U.S. Cl.
CPC ...
G01N 1/502 ; G01N 1/506 ;
Abstract

An on-line method for detecting particle size of a liquid during a process in which there is not a correlation between low absorbance with small particle size, the method comprises the steps of measuring a plurality of reference particle sizes each associated with a particular near infrared diffuse reflectance spectrum for creating a reference infrared diffuse reflectance spectrum having high absorbance with small particle size; measuring on-line a near infrared diffuse reflectance spectrum of the liquid during the process; and determining the particle size of the on-line liquid based on correlating the on-line-measured particle size with the reference near infrared diffuse reflectance spectrum.


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Switalski, Steven. (2003). On-line method for detecting particle size during a milling process (U.S. Patent No. 6600559). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6600559

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