The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Oct. 02, 2000
Tae-hee Kim, Suwon, KR;
Yun-woo Lee, Taejeonkwungyeok, KR;
Samsung Electronics Co., Ltd., Kyungki-do, KR;
Abstract
A method for evaluating the image quality of a color liquid crystal display (LCD), and a system for measuring the modulation transfer function (MTF) for use in the evaluation of the image quality. The image quality evaluation method involves measuring the MTF at a predetermined position on the screen of an LCD, and the image quality is evaluated using the measured MTF. The MTF measuring system, which includes a linear charge coupled device (CCD) camera equipped with a V(&lgr;) filter, is able to accurately measure the image quality of a color LCD by setting the measuring conditions through computer simulation. In addition, the resolution and signal-to-noise characteristics of an image displayed on the screen can be evaluated based on the measured MTF. Also, the problem of truncation of the line spread function (LSF) can be solved by fixing the scanning width. The spectral response characteristics of detectors can be made like those of the human eye using the V(&lgr;) filter. The MTF measurement can be effectively used in evaluating the image quality of color CRTs.