The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2003

Filed:

May. 30, 2002
Applicant:
Inventors:

Volker Kilian, München, DE;

Richard Roth, Unterhaching, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

The invention relates to a method for measuring the junction temperature in an electronic component. A periodic test signal is led via a signal path inside the component in order to obtain an internal signal. There is a frequency and/or phase relationship between the periodic test signal and a periodic external signal. A phase shift is measured between the internal signal and the external signal. The junction temperature is determined over the component region determined by the signal path as a function of the phase shift.


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