The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Jun. 27, 2001
Applicant:
Inventors:
Hideki Kumai, Kashiwa, JP;
Hiroyuki Takeuchi, Kashiwa, JP;
Assignee:
Hitachi Medical Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract
In processing of measurement data of each slab obtained by 3D-TOF multi-slab measurement, data in the overlapped portion of the slabs are weighted and added for each slice position. The weight function is calculated based on parameters set previously and is the same as the slab profile or an approximation curve thereof. The weighted and added data are normalized and reconstructed to obtain images. In the obtained image, signal difference between slabs can be suppressed.