The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2003

Filed:

Dec. 14, 2000
Applicant:
Inventors:

Nicholas J. Heaton, Houston, TX (US);

Charles Flaum, Ridgefield, CT (US);

Chanh Cao Minh, Katy, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C01V 3/00 ;
U.S. Cl.
CPC ...
C01V 3/00 ;
Abstract

A method that is usable with an NMR measurement apparatus includes averaging first spin echo trains acquired from different regions of a sample to form a second spin echo train. The first spin echo trains are used to produce a first estimate of a property of the sample, and the first estimate has a first resolution and a first accuracy. The second spin echo train is used to produce a second estimate of the property, and the second estimate has a second resolution that is lower than the first resolution and a second accuracy that is higher than the first accuracy. The first and second estimates are combined to produce a third estimate of the property. The third estimate has a third resolution near the first resolution of the first estimate and a third accuracy near the second accuracy of the second estimate.


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