The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Feb. 26, 2001
Mark M. Green, New York, NY (US);
Polytechnic University, Brooklyn, NY (US);
Abstract
Helical arrays comprising structurally different chiral non-racemic molecules or molecular entities that control the helical sense of the helical array provide a method for temperature measurement with a unique characteristic in that the temperature dependent chiral biases of the competing structurally different chiral non-racemic entities control the helical sense population since these biases differ in their temperature dependence. By varying the composition of the chiral non-racemic entities, the temperature at which the helical sense population is equal and how the helical sense population varies as a function of temperature can be controlled. In this way, competing structurally different non-racemic chiral groups can be varied in their composition so that a helical array can be formed under their effect and be sensitive to temperature over a wide temperature range. The resulting material, which can be used as a temperature measuring material or as a switch depending on fast reversible temperature changes, can be used in the context of a plastic unit, liquid displays, liquid crystals, and the like.