The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Feb. 14, 2002
Timothy Nordgren, Bothell, WA (US);
James Jago, Seattle, WA (US);
Gregory J. Friend, Seattle, WA (US);
Douglas Maxwell, Woodinville, WA (US);
Scott Easterbrook, Seattle, WA (US);
Deborah Imling, North Bend, WA (US);
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An ultrasound probe is provided for imaging and diagnosing areas of interest that are in immediate contact with the probe. The probe provides an integrated standoff comprised of a rubber material having optimal acoustic characteristics. The lens is directly applied to the transducer and the standoff is applied to the lens such that the focal zone is placed at the area immediately below the patient contact surface of the probe. The lens material also encapsulates the transducer and provides reliable protection against electrical shock. The standoff is also separated from the surface being examined by a cap comprised of a biocompatible elastomer having high chemical and abrasive resistance that enables the probe to be easily sterilized and disinfected and provides further protection against electrical shock. The use of a standoff with optimal acoustic properties in, combination with the arrangement of the lens, standoff and cap provides a probe with a focal zone placed at the area immediately below the probe. The lens, standoff and cap are spatially arranged to minimize the volume of the distal transducer section and overall probe such that the probe is easy to manipulate.