The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Mar. 02, 2000
Applicant:
Inventor:
Tetsuo Suzuki, Chiba, JP;
Assignee:
Seiko Instruments Inc., Chiba, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/00 ;
U.S. Cl.
CPC ...
G01N 3/00 ;
Abstract
A slit for probe-changing is provided above an opening for changing a test piece on a side of a test piece tube for installing test pieces. Probes are then taken out and inserted via this slit. Probes can therefore be changed without taking out the test piece tube or a thermocouple. This improves work efficiency and means that the work can be carried out in a confined space because the probes are pulled forward towards an operator and inserted in the opposite direction.