The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Jul. 31, 2001
Junzhong Liang, Fremont, CA (US);
James H. Burkhalter, Orlando, FL (US);
Alcon, Inc., Hunenberg, CH;
Abstract
Optical characteristics, including vision defects, of optical systems, such as the eye, are measured using a collimated beam from a diode laser focused at a position relative to the eye other than the retina for providing a finite source of secondary radiation on the retina of the eye, the image of which is close to a desired diffraction-limited spot. The secondary radiation is reflected back from the retina as a reflected wavefront of radiation that passes through the eye and is directed onto a wavefront analyzer where distortions associated with the reflected wavefront are measured. By focusing on the cornea through a long-focal-length lens and thus converging the beam through a small angle, as opposed to focusing a collimated light onto the retina, the need for lenses or lens combinations and the time required to adjust such to accommodate the different visual characteristics of each patient is eliminated.