The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
May. 21, 2001
Kent Vilendrer, Eden Prarie, MN (US);
Troy Nickel, St. Louis Park, MN (US);
EnduraTec Systems Corporation, Minnetonka, MN (US);
Abstract
A portable device for measuring the shear properties of a material specimen under applied dynamic circumferential forces against the specimen perpendicular to a longitudinal axis of said specimen. The device may further apply a dynamic force against an end of the specimen. The device includes clamps that hold the specimen at its proximal and distal end, wherein the circumferential force applied to the specimen is affectively applied between the two clamps. The temperature of the specimen may be held constant by controlling the temperature within an environmental chamber through the use of a closed loop PID control system. The force against the specimen is dynamically loaded by a dynamic load reaction frame consisting of a shear load actuator and load reaction structure. A microprocessor-based controller operates the dynamic load reaction frame under closed loop control. The microprocessor-based controller may be servo controlled, utilizing feedback from either a load transducer or either or both of two linear displacement transducers.