The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Nov. 24, 2000
Applicant:
Inventors:
Yiching Lin, Taichung, TW;
Chiafeng Chang, Hsi-Chih, TW;
Assignee:
Sinotech Engineering Consultants, Inc., Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/00 ; G01M 7/00 ;
U.S. Cl.
CPC ...
G01N 3/00 ; G01M 7/00 ;
Abstract
An evaluation device and an evaluation method for detecting quality of concrete structures comprising a conductive impact device, a sensing film, a receiver, an operation device and an auxiliary circuit, the device and the method is characterized by calculating a penetration time of the conductive film before measuring the depth of a crack in the concrete, and the evaluation work which conventionally requires dual receivers only needs now a single receiver for completion of the work. Therefore, cost and works for evaluation and signal analysis are reduced; this largely enhances the evaluation efficiency and technical level.