The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Jan. 24, 2000
Applicant:
Inventors:
Shaojie Li, Austin, TX (US);
Frank L. Wu, Austin, TX (US);
Assignee:
Dell Products L.P., Round Rock, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
The present disclosure describes a system and method for testing component IC chips. The system includes a management controller that has an embedded JTAG test routine operable to test one or more component IC chips associated with the management controller. The system further includes a memory associated with the management controller and the management controller is further operable to save a JTAG test routine result within the memory. More specifically, the management controller is operable to test one or more associated component IC chips using the embedded JTAG test routine during boot up of the system.