The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2003

Filed:

Feb. 28, 2000
Applicant:
Inventors:

Teresa L. McLaurin, Dripping Springs, TX (US);

Donald L. Tietjen, Austin, TX (US);

Alfred L. Crouch, Austin, TX (US);

Kristen L. Mason, Austin, TX (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
Abstract

A programmable clock generator ( ), which is part of an integrated circuit (IC) ( ), provides clock signals ( ) and ( ) to various components of the IC. The clock generator includes a PLL ( ) and one or more choppers ( ) which provide a desired waveform to the IC for testing purposes. When used in conjunction with a tester ( ), the IC can be scan tested at-speed using slower and less expensive testing equipment.


Find Patent Forward Citations

McLaurin, Teresa. (2003). Method and apparatus for testing an integrated circuit (U.S. Patent No. 6598192). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6598192

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…