The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Feb. 28, 2000
Applicant:
Inventors:
Showgo Matsui, Kawasaki, JP;
Katsuji Tabara, Kawasaki, JP;
Kazuhiko Takahashi, Kawasaki, JP;
Kunihiko Shiozawa, Kawasaki, JP;
Yoshiharu Ootani, Kawasaki, JP;
Syuzi Katase, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/05 ; G06K 9/00 ; G06F 1/750 ;
U.S. Cl.
CPC ...
H02H 3/05 ; G06K 9/00 ; G06F 1/750 ;
Abstract
A pattern data inspection method includes the steps of (a) carrying out a logical/sizing process with respect to original pattern data, (b) carrying out a reverse-logical/reverse-sizing process with respect to pattern data subjected to the logical/sizing process, and (c) carrying out a logical process with respect to the original pattern data and pattern data subjected to the reverse-logical/reverse-sizing process, and inspecting the pattern data subjected to the logical/sizing process.