The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Sep. 11, 2000
Stephen D Jordan, Ft Collins, CO (US);
Alan S Krech, Jr., Fort Collins, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A method and apparatus for executing an integrated circuit (IC) test program including at least one calling instruction partitions at least one called subroutine into first and second subroutine portions, loads IC test program instructions into a primary memory, loads the first subroutine portion into the primary memory contiguous with the calling instruction, inserts a memory transfer access instruction after the first portion, and loads a remainder of the IC test program instructions into primary memory. The method then executes instructions from primary memory. Execution of the calling instruction in the primary memory causes the second subroutine portion to be loaded into a FIFO element from a secondary memory. The first subroutine portion executes from the primary memory. Execution of the memory transfer access instruction initiates fetching and executing the second portion of the called subroutine from a first-in-first-out (FIFO) element.