The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Oct. 30, 1998
Applicant:
Inventors:
Yucel Altunbasak, Mountain View, CA (US);
Andrew Patti, Sunnyvale, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 ; H04N 5/21 ; H04N 5/225 ;
U.S. Cl.
CPC ...
G06T 5/00 ; H04N 5/21 ; H04N 5/225 ;
Abstract
Distortion correction in an imaging system using parametric motion estimation. Parametric motion estimation is used to correct for geometric lens distortion and illumination changes. Models for geometric lens distortion and different illumination models are presented, as is a method for an iterative linearising method of solving the resulting sets of nonlinear equations.
Altunbasak, Yucel. (2003). Correcting distortion in an imaging system using parametric motion estimation (U.S. Patent No. 6597816). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6597816
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile