The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Nov. 24, 1999
Masahiko Nagao, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A visual inspecting method for an electronic device, comprising steps of: photographing an image of a surface of the electronic device; dividing the photographed image into a plurality of unit regions and obtaining a distribution of gradation levels for each unit region; subtracting a predetermined offset value from the gradation level of the highest frequency selected from the gradation levels for each unit region so as to obtain a binarization level for each unit region; interpolating the binarization levels for unit regions so as to obtain a binarization level at each coordination position of the photographed image; and comparing the gradation level at each coordination position of the photographed image with the binarization level at each coordination position and determining that a defect is present at a coordination position where the gradation level thereat is lower than the binarization level thereat.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile